Researchers at the University of Illinois at Urbana-Champaign have shown for the first time that expensive aberration-corrected microscopes are no longer required to achieve record-breaking ...
Nearly 100 years ago, a seemingly simple discovery revolutionized the microscope. The introduction of phase contrast, which ...
The FEI 200kV Titan Themis Scanning Transmission Electron Microscope (STEM) is a scanning transmission electron microscope with several key capabilities. This microscope positions Michigan Tech ...
Researchers have shown that expensive aberration-corrected microscopes are no longer required to achieve record-breaking microscopic resolution. Researchers at the University of Illinois at ...
A comparison of experimental annular dark field (ADF)-scanning transmission electron microscopy (STEM) and electron ptychography in uncorrected and aberration-corrected electron microscopes. In the ...
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